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Measurement Techniques for Radio Frequency Nanoelectronics - The Cambridge RF and Microwave Engineering Series T. Mitch Wallis
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Measurement Techniques for Radio Frequency Nanoelectronics - The Cambridge RF and Microwave Engineering Series
T. Mitch Wallis
Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.
320 pages, 102 b/w illus. 4 tables
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | September 14, 2017 |
| ISBN13 | 9781107120686 |
| Publishers | Cambridge University Press |
| Pages | 328 |
| Dimensions | 178 × 253 × 18 mm · 790 g |
| Language | English |
