Characterisation of Radiation Damage by Transmission Electron Microscopy - Series in Microscopy in Materials Science - Jenkins, M.L (University of Oxford, UK) - Books - Taylor & Francis Ltd - 9780750307482 - November 21, 2000
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Jenkins, M.L (University of Oxford, UK)
Characterisation of Radiation Damage by Transmission Electron Microscopy - Series in Microscopy in Materials Science 1st edition

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Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.

224 pages, references, index

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 21, 2000
ISBN13 9780750307482
Publishers Taylor & Francis Ltd
Pages 234
Dimensions 150 × 220 × 20 mm   ·   540 g
Language English  

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